Researchers are advancing efforts to map genetic resistance to bacterial blight in cotton, a disease that can significantly reduce crop yields. In a recent experiment, Spoorti Gandhadmath placed 3.5-inch pots in a growth chamber, observing newly sprouted leaves within seven days of sowing from diverse cotton genotypes.
The work focuses on identifying genes that confer resistance to bacterial blight, caused by the pathogen Xanthomonas citri pv. malvacearum. This disease has long challenged cotton growers, particularly in regions where the bacterium can spread quickly under warm, humid conditions.
Each pot contained carefully selected seeds representing a range of cotton varieties, allowing researchers to compare how different genotypes respond to the pathogen. The rapid emergence of leaves within a week enables faster screening for resistant traits.
If successful, the mapping effort could lead to the development of resistant cotton strains, reducing reliance on chemical controls. This would benefit farmers through lower input costs and more stable yields, while also supporting sustainable agriculture.
The research remains in early stages, with field trials needed to confirm lab findings. Broader adoption of resistant varieties would also require collaboration with seed companies and agricultural extension services.